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Variable Pressure Scanning Electron Microscope

The Department of Earth Science at the Univeristy of Gothenburg has a Hitachi S-3400N variable pressure scanning electron microscope (VP-SEM) with a 200mm diameter sample chamber. The variable pressure range allows biological and other vacuum sensitive samples to be investigated. The large sample chamber together with the 5-axis eucentric motorized stage does not restrict the sample size and shape.

The SEM has a manufacturer guaranteed maximum resolution of 4nm that can be reached for conducting samples. The tested resolution for non-conducting materials is in the order of 200nm. Samples can be coated with carbon or gold at the Department of Eart and subsequently stored under dry conditions until they are analysed.

The HITACHI S-3400N at the department is equipped with an Oxford EDX spectrometer and one wavelength-dispersive crystal spectrometer. Additional detectors comprise a high contrast back scattered electron (BSE) detector, a secondary electron (SE) detector, a cathodoluminescence (CL) detector and an EBSD detector for crystal orientation measurements. User-friendly instrument control, data handling and analytical software runs on Windows®10 operating systems.

Kontaktinformation

Matthias Konrad-Schmolke

Institutionen för geovetenskaper
Göteborgs univseritet

E-post: mks@gvc.gu.se
Telefon: 031 - 786 2864

Sidansvarig: Henrik Thelin|Sidan uppdaterades: 2018-10-18
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